2010 DC Area FIB SEM Users Group Meeting

Washington DC-area Focused Ion Beam / Scanning Electron Microscope Users Meeting for 2010

What
When	Feb 25, 2010 08:30 AM to Feb 26, 2010 12:00 PM
Where	National Institute of Standards and Technology, Gaithersburg, MD
Contact Name	Keana Scott
Contact Phone	(301) 975-4579
Add event to calendar	vCal iCal

Preliminary Agenda (as of 14-Dec-2009)

Thursday, February 25th, 2010
8:30 AM	Breakfast & Coffee
9:00 AM	Welcome
Morning User Presentations
9:10 AM	Lynne Gignac, IBM Tom Zega, NRL Andras Vladar, NIST TBD
12:00 PM	Lunch & Poster Session Michael Anderson, NIST Rocco Cerchiara, Fischione Bradley Degregorio, NRL Gavin Murphy, NIH TBD
Afternoon Vendor Presentations
2:00 PM	Stephan Kleindiek, Kleindiek Nanotechnik John Dolon, Bruker AXS TBD
4:30 PM	Wrap-up of Day 1
5:00 PM	Happy Hour at Dogfish Head (across the street from NIST main gate)


Friday, February 26th, 2010
8:30 AM	Breakfast & Coffee
9:00 AM	Lab tours Tours will include NIST FIBs, Titan AEM, Helium Ion Microscope, CNST NanoFab Facility
11:00 AM	Group Discussions and Wrap-up