MicroNews Sep/Oct 1995

MicroNews

September/October 1995 Newsletter

of the Microbeam Analysis Society

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PRESIDENT'S MESSAGE

Dear Members:

As I begin my year as President of the Microbeam Analysis Society, I could not have asked for better preparation than attendance at the MAS 1995 meeting in Breckenridge, Colorado. The quality and importance of the work presented combined with the dedication and talents of the attendees all point to a strong future for this society. I hope that I can add, in some small way, to this strong future.

All those who contributed to the success of the Breckenridge meeting should know how much we appreciate their efforts on our behalf. We particularly thank Greg Meeker and all the members of the local arrangements committee as well as Edgar Etz, Ryna Marinenko and the other program committee members. So much hard work over such a long time resulted in a very successful meeting and these individuals deserve the credit and our thanks.

At the Breckenridge meeting, the MAS council discussed and took action on a number of issues of significance to the society and I would like to summarize these briefly below.

The future of the Journal of Microbeam Analysis was the issue with the greatest immediate impact. Over the past months, it has become increasingly clear that the Journal is not a financially viable activity for the publisher, VCH. This situation is due both to a lack of institutional subscriptions and a lack of advertising, resulting in a net loss to VCH for every issue published. The only way for VCH to continue to publish the Journal would be for MAS members, through the Society, to significantly increase their contribution to the cost of publication. The Council concluded that this was not acceptable and the contract with VCH will terminate with the publication of the last issue of the Journal for 1995.

The Council then considered several other journal options ranging from changing publishers to moving immediately to an electronic journal. In all of these discussions, a constant factor was the clear lack of demand for publication access to the current Journal. In spite of intensive efforts by the editor, the number of unsolicited contributed papers to the Journal of Microbeam Analysis amounted to a very low percentage

over the lifetime of the Journal. Faced with all the difficulties of financing a Journal for a society of our size, and with the need unclear, the Council decided that the responsible decision was for the Society to cease independent publication of a journal when the VCH contract ends.

This decision has the immediate effect of allowing a decrease in the Society dues, since a major part of the current dues are devoted to partially financing the Journal. The Council proposed a reduction in dues from $40 to $25 annually and this dues change was approved at the business meeting in Breckenridge.

The Council also voted to continue discussions with the Journal of the Microscopy Society of America (JMSA) regarding ways in which the MAS Journal might be incorporated into JMSA after independent publication ceases. These discussions have now resulted in an agreement in which, beginning in 1996, Microbeam Analysis will be officially incorporated into the Journal of the Microscopy Society of America and an Associate Editor will be appointed to represent MAS on the JMSA Editorial Advisory Board. Consistent with the reduced MAS dues, MAS only members will not receive subscriptions to JMSA.

Although this activity of the Society must come to an end, this fate is in spite of the heroic efforts of the Editor, Richard Linton. Against long odds, and to a large degree through his work alone, he has produced a publication in which the Society can take pride. We are very grateful for all his contributions to this effort, and as noted elsewhere in this newsletter, Richard Linton very deservedly was awarded the Presidential Service Award at the MAS meeting in Breckenridge.

The Council also discussed in detail, the role and nature of MAS topical conferences which will be planned to specifically benefit the MAS membership and which will complement the yearly Microscopy and Microanalysis meetings jointly sponsored by MSA, MAS and other societies. The Council concluded that such topical conferences should take a variety of forms ranging from short, single topic meetings held in conjunction with a national meeting, to several day, multi-topic conferences, essentially identical to our current national MAS meetings. The great success of the

I hope that your travel plans for next year already include Minneapolis, and for some, even Sydney!

Dale E. Johnson

President

Breckenridge meeting clearly demonstrated the value of retaining the latter approach as an important component of the desired range of possible topical conferences.

In addition, the Council recognized that, in order for these topical conferences to be of maximum benefit to the membership, it is essential that the members of the society be involved in the proposing and planning of these topical conferences. Mechanisms are being developed for that purpose.

As you know, the first jointly sponsored Microscopy and Microanalysis meeting will be held next year in Minneapolis and the Council concluded that this should also be the site of our first topical conference. Since the available time was too short for extensive input from the membership, the Council chose the subject of this first MAS topical conference to be "The current and future role of the World Wide Web in the Microanalytical Sciences". This conference will be held on the Sunday preceding the Minneapolis meeting and will be free to MAS members. John Mansfield will be organizing this inaugural topical conference and details (including a more accurate title) will be forthcoming. Watch your MicroNews.

Concerning MicroNews, several changes are also planned for this important publication. Inga Holl Musselman, who has done such an outstanding job as editor of MicroNews, will be leaving this post at the beginning of 1996 and will be a candidate for the position of Secretary of MAS in our elections this fall. Inga has earned the gratitude of the entire Society for her dedication to a high quality newsletter. Fortunately, Ryna Marinenko has agreed to become the new editor of MicroNews in 1996 and will continue the fine tradition of this publication.

Changes will also be occurring with MicroNews including a new schedule of three issues per year and all issues will be available regularly through the MAS homepage on the World Wide Web. Plans are being made so that soon, members may elect to receive MicroNews only through the World Wide Web. If you are not yet familiar with the MAS homepage, I urge you to take advantage of its constantly growing resources at:

http//www.engin.umich.edu/~jfmjfm/mas_folder /mashomepage.html

and as you do, keep in mind how much we are in debt to John Mansfield for launching us into "Web Space".

Finally, on behalf of MAS I want to thank John Small, Dave Simons, Joanna Batstone, and Charles Lyman as they finish their terms as officers of this society. I know that their contributions to MAS will not end with all that they have done as officers and we look forward to their continued involvement in building an even stronger society.

EMAIL/FAX NEEDED!

Membership services (1-800-4-MASMEM) is requesting that all members send in their email address and fax number for the files. Preferably send via email to scott.wight@nist.gov. Alternatively, send via snail mail to Scott Wight, MAS Member Services, PO Box 3552, Gaithersburg MD 20885.

MEETING AND SHORT COURSE

CALENDAR

Meetings

OKLAHOMA MICROSCOPY SOCIETY FALL TECHNICAL MEETING

IN CONJUCTION WITH THE 84TH ANNUAL MEETING OF THE OKLAHOMA ACADEMY OF SCIENCE

November 3, 1995

Alva, OK

Contact: Dean Phillips

(918) 661-8733

email: mdphill@ppco.com

MRS FALL MEETING

November 27 - December 2, 1995

Boston, MA

Contact: MRS, Meetings Department

9800 McKnight Road

Pittsburgh, PA 15237-6006

(412) 367-3003

(412) 367-4373 FAX

WINTER WORKSHOP ON ELECTRON DIFFRACTION AND IMAGING OF SURFACES

January 3 - 6, 1996

Scottsdale, AZ

Contact: Mrs. Sharon Willison

Center for Solid State Science

Arizon State University

Box 871704

Tempe, AZ 85287-1704

ACEM-14

Sponsored by Australian Society for Electron Microscopy, Inc., Microscopical Society of Australia, and International Union of Microbeam Analysis Societies

February 5 - 9, 1996

Sydney, Australia

Contact: ACEM-14 - microCOSMOPOLITAN

E. M. Unit

University of Sydney

NSW 2006

(+61 2) 351 2351

(+61 2) 552 1967

SCANNING 96

April 9 - 12, 1996

Monterey, CA

Contact: Mary K. Sullivan

Scanning 96

P.O. Box 832

Mahwah, NJ 07430

(201) 818-1010

(201) 818-0086 FAX

MICROSCOPY & MICROANALYSIS 96

Sponsored by MSA, MAS and MSC/SMC

August 11 - 15, 1996

Minneapolis, MN

Contact: MSA Meeting Office

P.O. Box MSA

Woods Hole, MA 02543

(800) 538-3672

(508) 548-9053 FAX

MICROSCOPY & MICROANALYSIS 97

Cleveland, OH

Short Courses

PRACTICAL ASPECTS OF SCANNING ELECTRON MICROSCOPY, PASEM 96

March 18 - 22 , 1996 Session I

March 25 - 29, 1996 Session II

College Park, MD

Contact: Tim Maugel

University of Maryland

Department of Zoology

College Park, MD 20742

(301) 405-6898

(301) 314-9358 FAX

LEHIGH MICROSCOPY COURSES:

June 10 - 14, 1996

SEM and X-ray Microanalysis

June 17 - 20, 1996

Advanced Scanning Electron Microscopy; Quantitative X-ray Microanalysis; Analytical Electron Microscopy

June 18 - 21, 1996

Atomic Force Microscopy and other Scanned

Probe Microscopies

Bethlehem, PA

Contact: Professor David B. Williams

Department of Matls Sci and Eng

Lehigh University

5 E. Packer Avenue

Bethlehem, PA 18015-3195

(610) 758-5133, (610) 758-4244 FAX

interSEM@lehigh.edu

MAS '95, BRECKENRIDGE

29th Annual Conference

of the Microbeam Analysis Society

Beaver Run Resort and Conference Center

Breckenridge, Colorado

August 6 - 11, 1995

Thank You! The dust has settled, we've had a chance to take inventory, and although the final numbers aren't in yet, MAS '95 appears to have been a tremendous success. From the Local Arrangements Committee and the Program Committee, a well deserved thank you to those who really made this year's annual meeting work - all of the attendees and their families who joined us in Breckenridge.

We are still trying to finalize the attendance figures, but with an error of about 1 percent there were 222 full registrations, 42 students, 17 one-day, and 22 sustaining members exhibiting, arriving at a total of 303 registrants. There were also many additional exhibitors, guests, spouses and children which brought the total to over 370 at the Tuesday night barbecue dinner. We won't have the final financial accounting for several weeks, but we do know that the meeting is in the black. MAS '95 was truly an international event with participants from thirteen countries. This demonstrates the strength of our society and should inspire all of us to support MAS by participating in future meetings and workshops.

MAS '95 began for our local society at the 1990 Seattle meeting when we were asked by John Armstrong and Al Romig to consider hosting MAS 1995 in Colorado. Over the last four years we have made many new friends and learned much about our organization and ourselves. It has been a very rewarding though sometimes frustrating experience. So many people have worked so very hard, especially during the last year. Those people are: Cathy Johnson, Mike Craig, Bob McGrew, Bob Klug, John Phelps, Marsha Simpkins, Joe Doyle, Pat Wolpert, Kim Jones, Nripen Roy, and Steve Crochiere. Sadly, Jim Potter, a member of the LAC and friend, passed away just three weeks before the meeting. Jim had put in many hours organizing the social activities for the meeting. I know he would have been extremely pleased with

the results of his efforts. I would like to acknowledge the students who gave their time and worked very hard at the meeting to make the audio-visual run smoothly and efficiently; Darin Aldrich, Rob Howbaker, John Nacthigall and Mark McGrew. Several people donated many long hours at the registration tables during the week of the meeting and deserve special thanks; Beth Nalty, Carol Hearne, Alice Mason, and Don Grimes. John Mansfield and Nestor Zaluzec deserve kudos for the hard work that went in to the always successful computer workshop. And a special acknowledgment to Cindy Zeissler who designed the beautiful meeting logo that we will all sport on our T-shirts in years to come. One more thank you must go to my wife Joyce and all of the spouses of the LAC members who have put up with our late nights and weekends over the eighteen months.

This meeting would not have been possible without the strong support of the MAS executive council, past and present, with a special thanks to Jon McCarthy, Harvey Freeman, Tom Huber, Dale Johnson and Joe Michael for all of their help and encouragement. In addition, thanks to past LAC chairs Jack Worrall, Gordon Cleaver and Peter Ingram for their advice and support.

This year's commercial exhibit was supported by 22 of our sustaining members. These companies deserve acknowledgment because without their participation the meeting would not have been possible. I would also like to thank all of the companies and institutions that provided additional financial support for the technical program. Both of these groups are listed in the meeting program booklet.

Of course, the main reason for having a meeting at all is to share new ideas and learn from the work of our colleagues. This year's technical program with over 200 papers, was truly outstanding due to the tireless efforts and hundreds of hours given by Edgar Etz, Ryna Marinenko and the members of the Program Committee. Over the last 18 months Edgar and I have spoken on almost a daily basis and have become good friends. That alone makes all of the effort worthwhile.

Again, thanks to all who attended MAS '95, Breckenridge. Let's all meet again next year in Minneapolis and help make next year's meeting just as successful as this year's.

Greg Meeker

LAC Chair, MAS '95

dent, and Greg Meeker, the Local Arrangements Chair, who are emphatically reporting, and I join them on this, that all of us fortunate enough to have been there, are looking back on a terrific meeting. Indeed, from all accounts, our gathering in Breckenridge will long be remembered, having fully exceeded all expectations for an MAS-only meeting. This success is due in large measure to the tireless work and dedication put in over the past year by all involved in the planning and execution of the Breckenridge Conference and, beyond that, by the response and participation of the conferees who came to stage the event.

Beyond the statistics on the number of registrants and other measures on the success of this year's Conference, the real indicators on the success of the program have been the personal comments, from so many, at the conclusion of the week, attesting to an excellent meeting, in every regard. As to the technical program of the Conference, we have again placed on record an outstanding scientific discourse that has resulted in a full four-and-one-half day program comprising four parallel sessions each day. The attendance of each of these sessions, and at several workshops, was full through Thursday of that week, slackening off a bit on Friday morning as the Conference wound down by Noon. Overall, during the course of the week, 32 half-day technical sessions were held in conjunction with four workshops. This program resulted in the publication of the Conference Proceedings containing 205 papers (extended abstracts), comprising a Proceedings volume of 460 pages, professionally put out by VCH Publishers, Inc., as the publication with title 'Microbeam Analysis - 1995', Proceedings of the 29th Annual Conference of the Microbeam Analysis Society, Edgar S. Etz, Editor.

I can comment only on selected highlights of the scientific program, the full detail of which is presented in the Final Program Booklet which outlined the agenda of the week (see also the May/June issue of MicroNews for details on Final Program). The tone for the Conference was set with the "Welcoming Remarks" presented on Monday morning at the outset of the Presidential Symposium. That introductory portion of the Conference program allowed for all conferees to jointly gather, to be welcomed also by Steve West, the Mayor of Breckenridge, who underlined the great natural beauty and many attractions of the location chosen as the site of the Conference. Steve West's comments were followed by Jon McCarthy's Presidential Symposium ("Emerging Detector Technology for X-Ray Spectroscopy") and the Presidential Awards Presentations. This year again, the individuals who have received the MAS Presidential Award are outstandingly qualified for that distinction. Thus, the Presidential Science Award was presented to Guillaume Bastin, the Heinrich Young Scientist Award to Neil Lewis, and the Presidential Service Award to Richard Linton. The Society is extremely pleased to have honored also on that occasion the recipients of the 'MAS Distinguished Scholar Award'. In all, 18 young student-scientists from various

Summary of Scientific Program

Report by Edgar Etz

Technical Program Chairman

Let me take this opportunity to present a brief report on the scientific program of the Breckenridge Conference, especially for the members of the Society who were not able to attend the meeting this year. This account is simply to augment the comments made by Dale Johnson, our Presi

universities across the U.S. and Canada, and one awardee from Belgium, were each presented with the Award for their outstanding papers brought to and presented at the Conference. I can't list their names and affiliations here, but these are given in the Final Program Booklet.

The technical program covered all of the traditional areas of microbeam analysis with particular emphasis on the most recent advances in electron beam techniques. Here, the topic of the Presidential Symposium presents an obvious focal point. A total of six half-day sessions centered on various aspects of analytical electron microscopy (AEM), covering both fundamental and applied issues relative to applications in the materials and biological sciences. Other sessions on x-ray microanalysis and electron microscopy delved into the problems of modeling electron beam/specimen interactions (topic of a specific workshop) and the resulting requirements for computational methods, jointly with the agenda on the latest consensus pertaining to the quantitation of x-ray spectra. Challenging many of these electron beam techniques to their present performance limits are the demands presented by nanotechnology, which became a session of special interest in the Program.

Peppered in amongst these more conventional program elements were various other well attended sessions that are indicative of the broad and in-depth scope of the meeting. Illustrative are the sessions on "Detection and Analysis of Soft X-Rays, "Environmental Scanning Electron Microscopy", and "Scanning Probe Microscopy". Obtaining molecular and bonding information from the analyzed specimen was the focal point of a number of different sessions based on the methods of microbeam mass spectrometry (MALDI and SIMS), infrared and Raman microspectroscopy, as well as micro- X-ray fluorescence and X-ray diffraction. Collectively, these chemical state techniques are progressively maturing as powerful methods of their own, as well as often essential adjuncts to elemental characterization. For the first time at an annual conference, the program included a special session on chemometric techniques for spectral analysis. The papers in this session dealt with a variety of different applications, utilizing artificial neural networks and principal component analysis in the treatment of various types of complex spectra. The session focusing on critical steps in sample preparation was well presented with a diversity of papers to illustrate the universal problems, and approaches to solving these, of achieving the most opportune sample preparation. A resounding success was the workshop announced this year as "Zaluzec's & Mansfield's Greatest Show on the PC Screen", namely Nestor's and John's group demo/discussion on the wonders of computer-based microanalysis and the evolving marvels from linkage to the internet. As always with their show, the two MCs entertained a most receptive audience. No doubt the most unusual, and perhaps most memorable, element of the week's program was the featured lecture given on Thursday morning at the start of the Special Session on 'The New Moon

after Apollo'. Here the keynote speaker was astronaut Captain John W. Young (of the Johnson Space Center, Houston, Texas), who had accepted our invitation, and presented a fascinating talk, with title "On the Moon with Apollo". This session had been organized to commemorate the 25th anniversary of microbeam analyses performed on the first lunar rock and soil materials. Last-minute changes to the Thursday AM program schedule allowed all conference participants to take in and enjoy John Young's talk, with this audience overflowing the largest lecture hall in the Conference Center. Capt. Young had been on several Gemini and Apollo missions (for example, as commander of Apollo 16, with lunar landing) and stressed the point, in his address, for the Nation to get back to scientific lunar exploration, urging the planning for a permanent research station on the moon. All points considered, the scientific agenda of this year's Conference reflects a healthful state of microbeam analysis. As members of this enterprise, we can look to a bright future with ever-widening horizons. This message was clearly taken back by everyone returning from the week in Breckenridge.

Let me close by thanking everyone who had a part in the shaping of the scientific program for MAS-'95. Especially my interactions with Greg Meeker and Jon McCarthy will be valued as among the best personal experiences during this campaign. My colleagues on the Program Committee (see listing below) have done a superb job in this assignment. My hope is that their organizational talents can be called upon again, whenever MAS requires them.

Lastly, I have come to conclude that my involvement in the organization of the Conference has provided me with a great deal of personal satisfaction from what others have now branded "a job well done". I thank the Society, through its officers past and present, for this rewarding opportunity.

For full and final program information on MAS-'95, a limited number of Final Program Booklets are still available through Greg Meeker. Copies of the MAS-'95 Proceedings volume, titled Microbeam Analysis - 1995, may be obtained from VCH Publishers, Inc., 220 East 23rd Street, New York, NY 10010-4606 (Tel: 212/683-8333, or Fax: 212/481-0897). The order number for this volume is SMTP #4142, and the price of a single copy is $ 125.00.

And, below this would appear the listing of the Program Committee, as follows:

PROGRAM COMMITTEE

Edgar S. Etz, Chairman Paul Carpenter

Ryna B. Marinenko, Co-Chair John M. Chalmers

Sally Asher Mark M. Disko

David S. Bright Derek J. Gardiner

John Callahan Paul Geladi

Donald A. Carpenter Danilo Golijanin

Figure 1. Zaluzec, Mansfield & Griffin at the Really Remote Computer Workshop

compressed file that contains source code, executable application, documentation etc and an abstract file that contains the same information as listed in the other format. The compressed file may be in ZIP, ARC, Stuffit or Unix compress (Z) format. If possible it should be a self extracting archive that installs all of the software on the users hard disk when it is run. Authors should please remember to make sure that the self extracting archive does not have the same name as one of the files that it contains as it will try and overwrite itself as it extracts.

If you wish to contribute a program to the MMSLib, you should assemble your submission in one of the two library formats and then send it to John Mansfield either by mail on floppy disk (address below) or via ftp. For specific instructions on submitting via ftp, please send email to John Mansfield at jfmjfm@umich.edu

Another new development is that two new sections to the library have been formed. One section is for shareware that is not specifically microscopy and microanalysis based but may be of use to our members, this section is called the ShareWare and FreeWare Library or SWFWLib. Software located to this section of the library often will not have an abstract in the MMSlLib format, but usually has an associated "Read Me" file which will contain vital instructions for the setup and use of the accompanying software. The second new section and the other section is for commercial demo software and is called ComDemo. The purpose of ComDemo section is to allow our sustaining members to offer demonstration versions of their software that users may test before they make a purchase. The software submitted to the ComDemo section should not be accompanyied by large amounts of advertizing, but rather an abstract file similar to those enclosed with the MMSLib submissions. This abstract file should contain a description of the program and its function, the type of computer required to run the software and the name and address of the person who should be

Horst W. Hahn Dale E. Newbury

Gary G. Hembree Clive Nockolds

Richard D. Leapman Skip Palenik

Jerry R. Lowney Klaus R. Peters

John F. Mansfield Michael T. Postek

Pamela A. Martoglio Guy Rimond

Jon J. McCarthy W. Ian Ridley

Stephen V. Medlin David R. Tallant

Gregory P. Meeker Akos Vertes

Thomas M. Moore Nestor J. Zaluzec

Patrick J. Moyer

MOUSIN' AROUND

Report on The Computer Activities

at MAS '95

As has become customary there was a computer workshop and software exchange at this year's meeting. Seven personal computers (three MS-DOS and 4 Apple Macintosh) were available for attendees to demonstrate, try-out and download software from the newly created Microscopy & Microanalysis Software Library (MMSLib). This software library is the result of the merger of the Microbeam Analysis Software Library (MASSL) and the Electron Microscopy and Microanalysis Public Domain Library.

In addition to the demonstrations and software exchange, there was a joint presentation by John Mansfield and Nestor Zaluzec that was an audience driven tutorial on video-conferencing, the World Wide Web, network file transfer, image acquisition and processing. This was an extremely popular event with over 120 attendees. There was much lively discussion which only terminated when people got hungry and started thinking about the barbeque!

Certain members of the conference decided to see just how far they could take remote network access and conducted a small parallel symposium at Mount Evans (see acompanying Figure 1.).

More About the MMSLib.

Since there were many cases where the software was duplicated in each library, management of this software will be considerably easier with a single merged library. There are over 70 shareware, freeware and public domain programs in the new library. Files are stored in the library in one of two formats. The first is in the form of three text files, an abstract file (called program_name.abs) containing information on the name of the program , it's functionality, the hardware necesary to run it and contact information on the author, the second text file (called program_name.src) contains all of the source code of the program and the third contains the program documentation and is called program_name.doc Examples of these files may be found on the MSSLib file server (currently ftp://www.engin.umich.edu/pub/MSA+MAS/MMSLib). The second format consists of a

contacted if the user wishes further information on the product. If the demo is a "crippled" copy of the full product then the abstract should note which functions do not work.

The MAS World Wide Web Server.

MAS is currently in the process of purchasing and setting up a dedicated World Wide Web Server for MAS business. This server will be a considerable improvement of the preliminary pages that have been put together by John Mansfield at the University of Michigan (http://www-personal.engin.umich.edu/~jfmjfm/mas_folder /mashomepage.html). In addition to information on MAS as a society, there will be electronic versions of MicroNews, a database of our sustaining members and how to contact them (with links to their home pages if they exist), a rapid publication electronic journal is also planned. The MMSLib and the associated ComDemo and SWFWLib directories will be available on the server via ftp. MAS specific mailing lists will be possible and an on-line membership directory is also possible. Future editions of Mousin' Around will announce the availability of these services as they come on-line.

John F. Mansfield, Computer Activities Committee

for president-elect, Inga Musselman for secretary, and Meredith Bond, Dawn Bonnell, V. P. Dravid, and Richard Linton as candidates for the two director positions. Two additional nominations for director were received from the floor - Greg Meeker and David Howitt. Each was seconded by 3 members, and each agreed to serve if elected. The slate of candidates was approved as amended.

Jon McCarthy gave a summary of the report produced by the ad-hoc committee on meetings that was established as a result of a motion from the floor at the 1994 business meeting. He described the options considered by the committee and the procedures used for evaluation. The committee recommended, and the executive council approved at its January 1995 meeting, that the society co-sponsor the Microscopy and Microanalysis meeting with MSA every year beginning in 1996, and further that MAS will sponsor or co-sponsor additional topical conferences on subjects relevant to our membership. The first proposed topical conference would be on the World Wide Web, organized by John Mansfield, and held immediately before the joint meeting in Minneapolis in 1996. Other meetings being considered for MAS sponsorship are a full-topic MAS meeting hosted by the MIKMAS group in Missouri in 1998 or 1999, and the IUMAS meeting in 2000. Dave Williams gave a report on IUMAS-96 in Sydney and expanded on the possibilities for IUMAS-2000 in the U.S. Jon McCarthy showed a viewgraph of other possible workshop topics discussed by the council, which is included with this report, and he invited suggestions from members.

Jon then gave an outline of the council deliberations regarding the Microbeam Analysis journal, in light of the expiration of the current contract with VCH in 1996. He discussed the options considered by the council:

(1) Continue publishing with VCH under a new contract with a dues increase.

(2) Publish with Don Grimes, editor of Microscopy Today.

(3) Publish with Elsevier by combining with Materials Characterization.

(4) Combine with the new Journal of the Microscopy Society of America, which would not automatically go to MAS members, resulting in a dues reduction to $25.

(5) Publish a peer-reviewed electronic journal on the World Wide Web.

(6) Discontinue any journal activity, resulting in a dues reduction to $25.

After careful consideration of all of these options, the council's recommendations were:

(1) Terminate the present contract with VCH at the end of 1995 and cease publication by VCH at that time.

(2) Reduce the MAS dues to $25 per year, effective in 1996.

(3) Continue negotiations with the MSA council on affiliation of MA with JMSA, under the guidelines that dues of MAS members will not be increased, and that affiliation will be completed by the end of 1995.

MINUTES OF MAS

BUSINESS MEETING, 8/10/95

The meeting began at 12:20 p.m. at the Beaver Run Resort in Breckenridge, with approximately 57 in attendance.

David Simons gave the secretary's report. He reviewed the minutes of the 1994 business meeting in New Orleans and they were approved.

The treasurer's report was given by Harvey Freeman. He proposed a balanced budget with income and expenses of $44,500 for 1996, assuming 550 regular dues-paying members, and a dues reduction from $40 to $25 per year. Details of the budget will be given in a future issue of MicroNews. The current assets of the society are about $175,000. The treasurer's report was approved.

Paul Hlava gave a report about the tour speaker program, and announced that the new tour speakers for 1996 would be Wil Bigelow, emeritus member, formerly of the University of Michigan, on vacuum techniques (Fiori tour speaker), Jon McCarthy of Noran Instruments on recent developments in EDS, and John Mansfield of the University of Michigan on environmental scanning electron microscopy.

A motion to approve affiliation of the Midwest Microscopy and Microanalysis Society with MAS was approved unanimously.

Dale Johnson gave the report of the nominating committee. He announced the slate of candidates for 1995: Joe Michael

(4) If negotiations with MSA are not successful, then MAS will not publish a journal after 1995.

(5) The option of some form of electronic publication on the MAS World Wide Web site will continue to be explored, but it will probably not be a formal peer-reviewed journal.

Many attendees offered comments and opinions, pro and con, regarding the recommendations. A motion was made to accept the recommendations of the council on the journal issue. An amendment to delete the dues reduction passed by a vote of 27-19. The original motion was then passed unanimously as amended.

A separate motion was made to reduce the dues for 1996 and beyond to $25 per year. After more discussion, the question was called and the motion passed by a vote of 28-14.

Jon McCarthy expressed the gratitude of the society to Greg Meeker, Edgar Etz, and the local arrangements committee for their excellent work on the Breckenridge meeting.

Jon McCarthy transferred the bead necklace, symbolic of the presidency of MAS, to Dale Johnson, who adjourned the meeting at 1:40 pm.

Respectfully submitted 9/4/95,

David Simons, Secretary, MAS

Let us here from you! We encourage you to give us your "vote". Please include topics not listed. Please send to Joe Geller at Geller MicroAnalytical Lab., 426e Boston St., Topsfield, MA 01983-1212, (508)887-7000, FAX: (508)887-6671, geller@world.std.com

MICROSCOPY AND MICROANALYSIS 96

August 11 - 15, 1996

Microscopy and Microanalysis 96 is the title of the MAS/MSA joint meeting to be held in Minneapolis. The theme of the meeting is Challenges in Microscopy and Microanalysis. The Meeting Executive Committee consists of Nestor Zaluzec - Program Chair, Ruth Dimlich - program co-chair and Joe Michael - MAS Program co-chair. This is the first time that MAS and MSA will hold a joint meeting where there are no symposium specifically designated as MSA or MAS. We hope to present a much more coherent meeting in this way and to reduce the number of parallel sessions.

Here are some of the exciting symposium for the 1996 meeting:

MAS Presidential Symposium - Training the Scientists and Engineers of Tommorrow - The Changing Scene

Recent Advances in AEM for the Physical and Biological Sciences (Jim Bentley, Meredith Bond)

Optical and FT/IR Microscopy in Materials and Life Sciences (John Reffner, E. Neil Lewis)

High Resolution XRD and XRF (Brian York)

Bulk Specimen Microanalysis - Current Status and Prospects for the Future (John Small, Ian Anderson)

Microbeam Mass Spectrometry (Susan Mackay, Steve Brian)

Scanning Probe Microscoy: Instrumentation and Applications (Inga Musselman, Phil Russell)

Applications of Low Vacuum/Environmental SEM (John Mansfield, Stuart McKernan)

Microscopy and Microanalysis of Ceramics (C. B. Carter, John Bruley)

High Resolution Field Emission SEM in Materials Science (D. C. Joy, Jim Pawley)

Grain Boundary MicroEngineering (David A. Smith, Doug Perovic)

Joe Michael

Program Committee

FUTURE MAS TOPICAL WORKSHOPS

At the MAS'95 meeting in Breckenridge, a questionnaire was distributed to attendees of the MAS business meeting to determine the membership's interest in future MAS Workshop topics. The subjects polled are listed below along with the average score (with 10 being the highest) from 20 participant's responses.

5.9 World Wide Web- On-Ramp Avenues For Everyone. How Do You Get There From Here?

5.5 Particulate Analysis-Preparation & Analysis Techniques Using A Variety Of Analytical Techniques.

5.4 Thickness Of Films & Coatings-From Angstroms to Millimeters. Specimen Preparation And Analytical Techniques.

3.8 What Can The Biologist Get From Microanalytical Techniques?

6.0 Scanning Probe Microscopes-What's Not An Artifact?

7.2 Trace Analysis-Or-How Low Can You Go? How Not To Detect Something That Isn't There. EDS, WDS, EELS, AES, SIMS.....

4.4 ISO Laboratory Certification-Say What You'll Do, And Do What You Say (But Don't Say Too Much). What's Minimally Necessary For Your Lab.

7.2 Quantitative Analysis-What's Out There. Let The Manufacturers, Public Domain And Shareware Authors Speak On Results From Specimens That We Have Provided For Analysis.

ELECTION OF OFFICERS

President

Joe Michael

Joe Michael has been actively involved in MAS for 10 years. He has organized many symposium for MAS only meetings and joint meetings with MSA. He organized the Analytical Sciences Symposia at the ICEM meeting held in Seattle in 1990 and edited the MAS Proceedings. Joe is currently the MAS co-chair for the Microscopy and Microanalysis '96 meeting to be held in Minneapolis. Joe is a former director of MAS.

Joe received his BS, MS and Ph.D. in Metallurgy and Materials Engineering from Lehigh University. Joe currently works in the Microstructural Characterization Department at Sandia National Laboratories in Albuquerque, NM where he directs the Scanning Electron Microscopy Laboratory and is actively involved in all aspects of electron microscopy. Prior to moving to Sandia, Joe spent 6 years at the Research Department of Bethlehem Steel where he was involved in the development of high strength low alloy steels. Joe has received the Heinrich Young Scientist Award and the Birks Award from MAS, the Burton Medal from MSA, and the Grossman Award from ASM. He has published over 70 papers in the area of materials and microanalysis.

Secretary

Inga Holl Musselman

Inga Holl Musselman is an Assistant Professor of Chemistry at the University of Texas at Dallas. She received her B.A. degree in chemistry from Gettysburg College in 1982 and her Ph.D. degree in analytical chemistry from the University of North Carolina at Chapel Hill (UNC-CH) in 1988. Her dissertation, under the direction of Rich Linton, was concerned with the application of laser microprobe mass spectrometry for the quantitation and chemical speciation of microscopic particles, involving collaborative studies with the microanalysis group at the National Institute of Standards and Technology. From 1988-1991, she held a postdoctoral appointment in Phil Russell's group in the Department of Materials Science and Engineering at North Carolina State University. There, she developed a patented technique to fabricate controlled geometry tips for the scanning tunneling microscope and also applied scanning probe techniques to the study of polymer surfaces. In 1991-1992, she was a visiting lecturer in the Department of Chemistry at UNC-CH. Her current research interests include the investigation of image contrast in scanning tunneling and atomic force microscopies, as well as the applications of these techniques to polymer surfaces.

Dr. Musselman has been a member of MAS since 1984 and is currently the MicroNews Editor. In 1985, she received the Castaing Award for the best student paper at the national

Joe Michael Inga Holl Musselman

Meredith Bond Vinayak P. Dravid

David Howitt Richard W. Linton

Gregory P. Meeker

MAS meeting. She served as co-chair of the Scanned Probe Microscopies Symposium at the 1994 MAS/MSA meeting in New Orleans and will again serve as co-chair of this session at Microscopy and Microanalysis 96 in Minneapolis. In addition to MAS, she is a member of the American Chemical Society and the American Vacuum Society.

Director

Meredith Bond

Vinayak P. Dravid

David Howitt

Richard W. Linton

Gregory P. Meeker

Meredith Bond

Meredith is Associate Staff in the Department of Molecular Cardiology of the Cleveland Clinic Research Institute. She obtained her PhD in 1984 from the Department of Physiology at the University of Pennsylvania in the area of electron probe microanalysis of vascular smooth muscle. During a two year post-doctoral fellowship at the Pennsylvania Muscle Institute, University of Pennsylvania, she further expanded her interests in rapid freezing technology and high resolution microanalysis of rapidly frozen tissue. Shortly after joining the staff of the Cleveland Clinic Research Institute in 1986, Meredith set up a dedicated analytical electron microscopy facility. This formed a part of the Electron Microscopy Core Facility of the Cleveland Clinic Research Institute, of which she is Core Director. She has over 40 peer-reviewed publications, reviews and book-chapters, most of which are on the subject of biological microanalysis. Meredith is also an ad hoc member of the Special Study Sections of the Division of Resource Resources at NIH which reviews electron microscopy grant applications.

Meredith has been an active member of MAS since 1988. In 1992-3, she was an MAS Sponsored Speaker; she was also Organizer and Chair of the MAS Biological Symposium at the combined MSA/MAS meeting in New Orleans in 1994; in addition, she has organized several presentations in the area of Microbeam Analysis for the Microscopy Society of Northeastern Ohio (MSNO), of which she has been Secretary (1991-1993) and is currently President-Elect. For the 1996 Microscopy and Microanalysis Meeting, she is a member of the Program Committee and Co-Chair of the Symposium on "Recent Advances and Challenges in Analytical Microscopy in the Physical and Life Sciences"; in addition, Meredith is a member of the Program Committee and Local Arrangements Committee for the 1997 Microscopy and Microanalysis Meeting in Cleveland.

Vinayak P. Dravid

Vinayak P. Dravid is an associate professor with the department of Materials Science and Engineering at Northwestern

University, Evanston, IL. He also serves as the director of the newly formed Electron Probe Instrumentation Center (EPIC).

Vinayak obtained his B.Tech. in Metallurgical Engineering from I.I.T. Bombay, INDIA in 1984. After one year of industrial experience, he opted to pursue graduate studies at Lehigh University, Bethlehem, PA, where he obtained his PhD in Materials Science & Engineering in October 1990. He has been with Northwestern University since his graduation.

Vinayak's research and teaching interests revolve around nanoscale phenomena, with an emphasis on synergistic applications of diverse analytical techniques to solve complex nanoscale problems. He has primarily been active in analytical TEM studies of nanostructured materials and interface phenomena. He is a recipient of a NSF Young Investigator award (NYI), IBM faculty development award and Exxon education foundation grant. He has authored over fifty publications in various international journals and has contributed to several book chapters. He teaches undergraduate and graduate courses related to electron microscopy and makes time to deliver lectures or conduct open-houses for local area school/college students in the same subject matter.

Vinayak has been active in MAS and MSA right from his graduate days. He has been a member of MAS since 1986, and has received several MAS and MSA awards as a graduate student at Lehigh. He is also a member of several materials related societies and has contributed as symposium organizer, session chair and in similar related activities. He is the faculty advisor to local student chapters. He serves on the editorial board of the international journals: Microscopy, Microanalysis and Microstructure (MMM, France), and the Journal of Microscopy (U.K., from January 1, 1996).

David Howitt

David Howitt is a Professor of Materials Science at the University of California at Davis. He has been an active member of MAS for over 20 years and was Program Chairman for the 25th Anniversary in San Jose. David would like to see the MAS becoming more active in recruiting new members and is interested in encouraging the council to support the expansion of the local chapters by developing such things as student society affiliations and MAS workshops.

Richard W. Linton

Richard W. Linton received his B.S. degree with Highest Honors from the University of Delaware in 1973 and his Ph.D. from the University of Illinois in 1977, both in chemistry. He is currently Associate Vice-President for Research of the University of North Carolina (UNC) System

General Administration and Professor of Chemistry at the University of North Carolina- Chapel Hill. His administrative responsibilities include oversight of the extramural funding of UNC programs (~$500M in FY95), and promotion of cooperative research within the UNC institutions, with foreign institutions, and between UNC and industry.

Dr. Linton's academic specialty is analytical chemistry, emphasizing surface spectroscopies and microanalysis techniques such as XPS and SIMS. His research group currently addresses a diversity of applications spanning the environmental, biological, polymer, and materials sciences, including extensive cooperative programs with industry (e.g. Charles Evans and Associates, Glaxo-Wellcome, Hoechst Celanese, Monsanto, and Radian Corporations). Dr. Linton has co-authored approximately 150 technical publications, and has graduated 25 Ph.D. students during his career at UNC-Chapel Hill. He has served on the boards of directors for national scientific bodies such as MAS and AVS (Applied Surface Science Division), as well as program committees for many national and international scientific conferences (e.g. ACS, AVS, ICMCTF, MAS, SIMS).

Dr. Linton has been very active in MAS since 1975, has been a member of the MAS Council (1988-90), a member of the local arrangements or program committees for various MAS meetings (1989, 1991, 1992, 1993), the chair of the MAS Publications Committee since 1989, an MAS tour speaker, and the Editor-in-Chief of Microbeam Analysis from 1991-1995. He has also received two MAS Awards: The Heinrich Award for the Outstanding Young MAS Scientist in 1990, and The Presidential Service Award in 1995. He looks forward to assisting MAS to enhance its niche in microanalytical sciences by supporting expanded topical conferences and electronic communications, as well as by promoting cooperative ties with international microbeam groups and microscopy societies such as MSA.

Gregory P. Meeker

Greg Meeker received his BA, and MS in geology from California State University, Los Angeles. From 1977 to 1983 he was a research assistant at the California Institute of Technology where he developed his microbeam analysis skills on the electron microprobe and SEM. While at CALTECH Greg was involved in meteorite and lunar research and was curator of the lunar and meteorite sample collections.

In 1983 Greg accepted a position at Charles Evans & Associates where he worked for six years as Analyst, Manager of Auger Services, and Senior Research Analyst. While at Evans & Associates, Greg developed techniques for the analysis of dielectric materials using Auger electron spectrometry and was responsible for two major SBIR research contracts focusing on plasma source ion implantation and sputtered neutral mass spectrometry.

In 1989 he moved to Denver as a Research Geologist and Chief of the Denver Electron Microprobe Project at the U.S. Geological Survey. Greg's current research interests include the study of meteorites, volcanoes, and the application of microbeam digital imaging techniques to geological materials. Greg has published over 30 scientific papers on a wide variety of topics including SIMS analysis of ion implanted steels, infrared studies of Martian analogue soils, and microbeam analysis of terrestrial and extra-terrestrial materials.

Greg has been a member of MAS since 1983, and a member of the Colorado Microbeam Analysis Society since moving to Denver. He has served as Local Area Representative for MAS for five years, and was involved in the organization of several two-day symposia sponsored by the local society. Greg was the Chairman of the Local Arrangements Committee for MAS '95 held in August in Breckenridge, Colorado.

BATSTONE HONORED BY

MICROSCOPY SOCIETY OF AMERICA

Joanna L. Batstone of the IBM Thomas J. Watson Research Center, and a member of the Microbeam Analysis Society, received the 1995 Burton Award for her contributions to electron microscopy from the Microscopy Society of America. The award was presented at a ceremonial session during the Society's meeting in Kansas City, MO.

The Burton Award, established in 1975, is awarded annually to nominees under age 35 who have made important contributions to the field of microscopy, imaging and compositional analysis. It is one of the highest honors bestowed by the Microscopy Society.

Batstone received her Ph.D. in physics from the University of Bristol, UK, in 1985 and jointed IBM in 1989. Since joining IBM, her work has included structural and electronic properties of defects in semiconductors. Most recently, she has been working in the computer sciences, specifically on user interface design for interactive applications such as electronic commerce.

Biographical sketch:

Education

1976-1979: School of Chemical Physics, Univ. of Bristol, Bristol, UK. B.Sc. Honours II(ii) in Chemical Physics.

1979-1980: H.H. Wills Physics Laboratory, Tyndall Ave., Bristol, UK. M.Sc. in The Physics of Materials. Thesis: A Microstructural Investigation of Au-Ge-Ni Contacts to InP.

1980-1983: EM Group, H.H. Wills Physics Laboratory, Bristol, UK. Ph.D. in Physics. Thesis: The Role of Boron in the Creep Ductility of 316 Stainless Steel.

Professional Experience

06-12 1983: Electron Microscopy Group, H.H. Wills Physics Laboratory,Tyndall Avenue, Bristol, UK. Post-Doctoral Assistant.

02-1984 to 08-1986: Electron Microscopy Center for Materials Research, Argonne National Laboratory, Argonne, Illinois, 60439. Post-Doctoral Appointee.

09-1986 to 07-1987: Microelectronics Center of North Carolina, 3021 Cornwallis Road, Research Triangle Park, NC, 27709. Visiting Scientist.

08-1987 to 08-1994: Electron Microbeam Analysis Laboratory, University of Michigan, 2455 Hayward Street, Ann Arbor, Michigan 48109-2143. Assistant Research Scientist and Laboratory Manager.

08-1994 to present: Electron Microbeam Analysis Laboratory, University of Michigan, 2455 Hayward Street, Ann Arbor, Michigan 48109-2143. Associate Research Scientist and Laboratory Manager.

New and Emerging Technology for X-ray Spectroscopy in Microanalysis

Jon J. McCarthy

NORAN Instruments, Inc.

2551 W. Beltline Highway

Middleton, WI 53562

(608)831-6511 FAX: (608)831-2313

jonm@noran.com

Abstract:

This talk will present highlights of the 1995 MAS Presidential Symposium, presented in Breckenridge, CO this August. In this symposium, several new detector technologies were discussed that offer the potential to improve the peak resolution, count rate capability, or ease of use of EDS sytems compared to the best Si(LI) and HPGe detectors in common use today. The status and performance of devices such as superconducting microcalorimeters with peak resolution of 10 eV, silicon drift chambers capable of count rates exceeding 1 million counts per second, and compound semiconductors such as HgI2 and CdZnTe that operate at near room temperature will be reviewed. How and when these these devices may be available for use in microanalysis will be indicated. Finally the impact of the newly introduced digital pulse processing techniques for microanalysis systems will be discussed.

THE MAS TOUR SPEAKER PROGRAM

FOR 1995-1996

As most of you know, MAS sponsors a tour speaker to each of the Affiliated Regional Societies once a year. Paul Hlava has been in contact with most of the ARS and has a tentative "wish list" of speakers and dates. We have three candidate tour speakers for your consideration, this year. They are Jon McCarthy of Noran Instruments, Inc., John Mansfield of the University of Michigan, and Will Bigelow of the University of Michigan, emeritus. The titles and abstracts of their talks are listed below along with a short bio for each. If Paul has not talked to your program organizer, make sure that he/she contacts Paul and soon because he will start confirming availability and organizing the tours.

Applications of Environmental Scanning Electron Microscopy

John Mansfield

University of Michigan, North Campus EMAL, 413 SRB

2455 Hayward

Ann Arbor, MI 48109-2143

(313)936-3352 FAX: (313)936-3352

jfmjfm@umich.edu

Abstract:

When you mention Environmental Scanning Electron Microscopy, typically people think that you mean the instrument manufactured by ElectroScan. While the ElectroScan instrument was the only such instrument available initially, there are now a range of similar instruments from a number of vendors. The names that these instruments have been given vary, e.g. "Wet SEM" (Topcon), "Low Vacuum SEM" (JEOL) "Variable Pressure SEM" (Hitachi) and "Environment-Controlled SEM" (Amray), however they all have the capability of viewing the sample in an environment. Although performing SEM in an environment has an interesting number of new applications, it also introduces a whole host of new possible problems for the microscopist. Thankfully these can typically all be solved and the instruments are now powerful tools in the SEM lab. The University of Michigan Electron Microbeam Analysis Laboratory has been home to the Amoco Foundation Environmental Scanning Electron Microscope for over five years now and it has been used for a wide range of applications in both materials and biological sciences. There are a large number of different sample stages for this instrument (hot, cold, straining, scratch test and diffraction) and as a result the instrument is frequently used as a "microlaboratory", where all manner of in-situ experiments are performed.

John Mansfield's presentation will focus on the flexibility of the Environmental SEM, how the problems associated with SEM in an environment are overcome and provide examples of applications in materials and biological sciences.

Biographical sketch:

Jon J McCarthy recieved his PH.D. in experimental Physics from Iowa State University in 1973. After a post-doctoral at the Center for Radiation Research at NBS (now NIST), he joined what was to become NORAN Instruments in 1975, where he has been involved in research and development of products for the nuclear, microanalysis and optical instrumentation markets. Currently, Jon is Director of Technology for NORAN, and is responsible for new technology development, merger and acquisition activity, and long range strategic planning. Jon has presented or published over 40 scientific publications, most of which are in the field of electron beam microanalysis.

Jon has been a MAS member since 1978, and has served the society in a variety of ways, as a Director of the Society, a program chair, corporate liaison, a previous MAS tour speaker, and most recently as MAS president for 1994-1995. In the future, Jon is serving as MAS program co-chair for the Microscopy and Microanalysis 1996 meeting and as the MAS program chair for the same meeting in 1997.

Vacuum Methods in Electron Microscopy

Wilbur C. Bigelow

1136 Mixtwood Road

Ann Arbor, MI 48103

Abstract:

Wilbur Bigelow's tour lecture will be based on his book, Vacuum Methods in Electron Microscopy, and will be oriented towards giving listeners a more comfortable understanding of how to use their vacuum systems most effectively. It will first develop several fundamental principles which are important in understanding the functioning of vacuum systems. Then the application of these principles to the operation of some typical systems will be discussed. Finally, some newer types of pumps being used on vacuum systems to control oil contamination will be described.

Biographical sketch:

Wilbur C. Bigelow is Professor Emeritus in the Department of Materials Science & Engineering at the University of Michigan. Professor Bigelow taught courses dealing with electron microscopy, electron and x-ray diffraction, and electron microprobe analysis for more than thirty years. He joined the Electron Microscopy Society of America in 1954, and served it in the capacity of national program chairman, a member of the board of directors, and membership secretary before becoming its president in 1969. He is a charter member of the Microbeam Analysis Society of America, and has served as president of its Michigan chapter. In 1965 he founded the Electron Microbeam Analysis Laboratory at the University of Michigan, and served as its Director until 1987. His latest major endeavor was the writing of a book on Vacuum Methods in Electron Microscopy which was published in 1994 as the 15th volume in the popular series Practical Methods in Electron Microscopy, of which Dr. Audrey Glauert is the Editor.

OKLAHOMA MICROSCOPY SOCIETY (OMS) ANNUAL MEETING

The Oklahoma Microscopy Society will hold their Fall Technical Meeting in conjunction with the 84th Annual Meeting of the Oklahoma Academy of Science in Alva, Oklahoma, on November 3, 1995. Scheduled keynote speakers in the biological and physical sciences include Katherine Kocan, Oklahoma State University, talking about her recent research in Africa on tick-borne diseases and Deborah Hess, Phillips Petroleum Company, speaking on x-ray photoelectron spectroscopy. Contributed papers from students and scientists within the state will also be presented. The 7th Annual Timpano Student Competition, commemorating the late Dr. Peter Timpano, will be held at the meeting. This award is given to the student member of OMS presenting the best paper and pays the expenses for the winner to present their research work at the national meeting of the Microbeam Analysis Society or the Microscopy Society of America. A micrograph competition will also be held with the winning micrographs being used for the covers of the two OMS Newsletters published each year. The first place winner of last years competition, David Palmer from Oklahoma State University, recently won first place in the micrograph competition at the Microscopy Society of America meeting in Kansas City. His micrograph demonstrated the effect of the bacterial phytotoxin coronatine on a palisade mesophyll cell in a tomato leaf. For more information on the OMS Fall meeting, contact Dean Phillips at (918) 661-8733, email: mdphill@ppco.com.

POSITION WANTED

Position sought in materials characterization. Materials Science Ph.D (Dec 1995) thesis focuses on TEM study of small catalyst particles. Well-experienced in materials, microscopy (conventional, HREM), spectroscopic techniques, and image processing. Excellent communication skills. Direct FAX to Ajay Singhal 217-244-2278.

EDITOR'S NOTE

I welcome contributions to MicroNews from MAS members and from Affiliated Regional Societies including meeting and short course announcements, employment: offered and wanted, and any analytical tips you wish to pass on to your colleagues. Please contact me and/or submit your contribution on disk (I use a Macintosh IIci, Word 5.0) or by email. I look forward to hearing from you.

Inga Holl Musselman, MicroNews Editor

Chemistry Program, BE26

University of Texas at Dallas

Box 830688

Richardson, TX 75083-0688

(214) 883-2706; (214) 883-2925 FAX

email: imusselm@utdallas.edu

MAS EXECUTIVE COUNCIL

President

Dale E. Johnson

Graduate School AG-10

University of Washington

Seattle, WA 98195

(206)543-5900 FAX: (206)685-3234

dej@u.washington.edu

Past-President

Jon McCarthy

NORAN Instruments, Inc.

2551 W. Beltline Highway

Middleton, WI 53562

(608)831-6511 FAX: (608)831-2313

jonm@noran.com

Treasurer

Harvey A. Freeman

958 Long Pond Road

Brewster, MA 02631-1898

(508)896-9060 FAX: (508)432-8951

harvey.freeman@um.cc.umich.edu

Secretary

David S. Simons

National Institute of Standards and Technology

Bldg. 222, Rm. A113

Gaithersburg, MD 20899

(301)975-3903 FAX: (301)216-1134

david.simons@nist.gov

DIRECTORS

Joanna L. Batstone (1993-1995)

IBM T. J. Watson Research Center

P. O. Box 704

Yorktown Heights, NY 10598

(914)784-7674 FAX: (914)784-6324

joanna@watson.ibm.com

Charles E. Lyman (1993-1995)

Department of Materials Science and Engineering

5 East Packer Avenue

Lehigh University

Bethlehem, PA 18015

(610)758-4249 FAX: (610)258-4244

cel1@lehigh.edu

Paul F. Hlava (1994-1996)

Sandia National Laboratories

Department 1822, MS-1405

Albuquerque, NM 87185-1405

(505)844-1890 FAX: (505)844-2974

pfhlava@sandia.gov

Carol Swyt (1994-1996)

National Institute of Standards and Technology

Bldg 222, Rm. A113

Gaithersburg, MD 20899

(301) 975-3926 FAX: (301)216-1134

swyt@gapnet.nist.gov

Joseph D. Geller (1995-1997)

426e Boston Street

Topsfield, MA 01983-1212

(508)887-7000 FAX: (508)887-7000

geller@world.std.com

John F. Mansfield (1995-1997)

University of Michigan, North Campus EMAL, 413 SRB

2455 Hayward

Ann Arbor, MI 48109-2143

(313)936-3352 FAX: (313)936-3352

jfmjfm@umich.edu

SUSTAINING MEMBERS

Our Sustaining Members Contribute Substantial Support to MAS

4pi Analysis, Inc.

Durham, NC 27707

(919)489-1757 FAX: (919)489-1487

Contact: Michael Czysz / Scott Davilla

Mac-based EDS & Imaging, Hard- and Software

Advanced MicroBeam, Inc.

Vienna, OH 44473

(216)394-1255 FAX: (216)394-1834

Contact: Donald P. Lesher

Microprobe Service, Automation, Image Analysis

Amray, Inc.

Bedford, MA 01730

(617)275-1400 FAX: (617)275-0740

Contact: Kenneth Benoit / Sheldon Moll

Manufacturer of Scanning Electron Microscopes

Cameca Instruments, Inc.

Trumbull, CT 06611-1356

(203)459-0623 FAX: (203)261-5506

Contact: Andrew Davis / Claude Conty

EPMA, SIMS, Analytical SEM, and FE/Auger

Charles Evans & Associates

Redwood City, CA 94063

(415)369-4567

Contact: Jeff Kingsley / Mike Edgell

Service Analysis Lab., Mass Spec., RBS

Dapple Systems

Sunnyvale, CA 94086

(408)733-3283 FAX: (408)736-2350

Contact: William Stewart

EDS Systems, Image Capture and Analysis

Denton Vacuum, Inc.

Moorestown, NJ 08057

(609)439-9100 FAX: (609)439-9111

Contact: George Lutz / James L. Campbell

Vacuum Coaters and Critical Point Dryers

EDAX International

Mahwah, NJ 07430

(210)529-6277 FAX: (201)529-3156

Contact: Tony Williams / Paul Oravitz

Microanalysis Systems Utilizing PC or MAC

Electron Microscopy Sciences / Diatome US

Fort Washington, PA 19034

(800)523-5874 (215)646-1566 FAX: (215)646-8931

Contact: Carole March / Stacie Kirsch

EM and LM Supplies and Diamond Knives

ETP-USA / Electron Detectors, Inc.

Livermore, CA 94550

(510)449-8534 FAX: (510)449-8996

Contact: Robert J. Ruscica

Robinson BSE Det. & Infrared Chamberview Sys.

FEI Company

Hillsboro, OR 97124-5830

(503)640-7500 FAX: (503)640-7509

Contact: Andree Kraker / Doug Rathkey

LaB6 & CeB6 Tips, FIB & FIB/SEM Workstations

Fisons Instruments

Valencia, CA 91355

(805)295-0019 FAX: (805)295-8714

Contact: Joe Robinson / Mike Davidson

Energy-dispersive X-ray Analysis Systems

Gatan, Inc.

Pleasanton, CA 94588-3334

(510)463-0200 FAX: (510)463-0204

Contact: Peter Swann / Christopher Byrne

TEM Accessories and Specimen Prep. Equipment

Geller MicroAnalytical Laboratory

Topsfield, MA 01983-1200

(800)MICRO-LL (508)887-7000 FAX: (508)887-6671

Contact: Joseph D. Geller / Charles Herrington

EPMA,SEM/EDS,& Auger Services-EM Standards

Hessler Technical Services

Stamford, CT 06902

(203)358-0266 FAX: (203)358-0266

Contact: Robert Hessler

Sales and Marketing Representative

JEOL USA, Inc.

Peabody, MA 01960

(508)535-5900 FAX: (508)536-2205

Contact: Robert Santorelli / Charles Nielsen

EPMA, Auger, SEM, TEM, NMR, Mass Spec

RJ Lee Instruments Ltd.

Trafford, PA 15085

(412)744-0100 FAX:(412)744-0506

Contact: David Crawford / Dr. Fred Schamber

PERSONAL SEM for failure analysis, QA, etc.

Lehigh University

Bethlehem, PA 18015

(610)758-4249 FAX:(610)758-4244

Contact: David Williams / Charles Lyman

Education in SEM, AEM, AFM, & Microanalysis

Leica, Inc.

Deerfield, IL 60015

(800)248-0123 (708)405-0123 FAX: (708)317-7268

Contact: Kevin Dauwalter / Norm Burns

SEM, Optical, & Scanning Confocal Microscopes

Materials Analytical Services, Inc.

Norcross, GA 30092

(800)421-8451 (404)448-3200 FAX: (404)368-8256

Contact: Mark Rigler / Bill Longo

FTIR,EDXRF,S(TEM),SEM,FIB,STM&XRD Serv.

McCrone Associates, Inc.

Westmont, IL 60559

(708)887-7100 FAX: (708)887-7417

Contact: Kent L. Rhodes / John Gavrilovic

Materials Characterization & Surface Analysis

Micron, Inc.

Wilmington, DE 19805-1599

(302)998-1184 FAX: (302)998-1836

Contact: James F. Ficca, Jr.

Analytical Services OM, SEM/EDS, TEM, & EPMA

Microspec Corporation

Fremont, CA 94539

(510)656-8820 FAX: (510)656-8944

Contact: Joseph Carr / William D. Donnelly

Wavelength-Dispersive Spectrometers for SEMs

Nissei Sangyo America, Ltd.

Hitachi Scientific Instruments

Mountain View, CA 94043

(415)969-1100 FAX: (415)961-0368

Contact: Donna Armanino / Hideo Naito

SEM, TEM, & Field-Emission SEM and TEM

NORAN Instruments, Inc.

Middleton, WI 53562

(608)831-6511 FAX: (608)836-7224

Contact: Gary Hawkinson / Mary Ales

Microanalysis Systems & Confocal Microscopes

Osmic, Inc.

Troy, MI 48084

(800)366-1299 (810)362-1290 FAX: (810)362-4043

Contact: Nick Grupido / George Gutman

Multilayer Crystals for WDS Spectrometers

Oxford Instruments, Inc., Microanalysis Group

Concord, MA 01742-2204

(508)369-9933 FAX: (508)369-8287

Contact: Helen Corry / John Benson

Link EDS Systems, EM Cryo Access., CL & BSD

Park Scientific Instruments

Sunnyvalle, CA 94089

(408)747-1600 FAX: (408)747-1601

Contact: Dave Campbell / John Yarboro

A Complete Line of Scanning Probe Microscopes

Physical Electronics Inc.

Eden Prairie, MN 55344

(800)328-7515 (612)828-6100 FAX: (612)828-6322

Contact: Greg Carpenter

Surface Analysis Inst., Auger, XPS, & SIMS

Philips Electronic Instruments

Mahwah, NJ 07430

(201)529-3800

Contact: Nathan Little / John S. Fahy

XL Series SEMs and CM Series TEMs

Princeton Gamma-Tech

Princeton, NJ 08540

(609)924-7310 FAX: (609)924-1729

Contact: Doug Skinner

EDS & Image Analysis for EM and OM

SEM / TEC Laboratories, Inc.

Phoenix, AZ 85040

(602)276-6138 FAX: (602)276-4558

Contact: Sam Giallanza / Ed Holdsworth

Materials & Failure Analysis Service Lab.

Small World

San Mateo, CA 94402

(415)345-8013 FAX: (415)345-8013

Contact: Don Chernoff

Electron Flight Simulator, EDS standards

Soft-Imaging Software Corporation

Goldon, CO 80401

(303)274-0341 FAX:(303)274-0341

Contact: Dr. Michael Bode

Software & Hardware for Image Acquisition

Spectra-Tech / Nicolet

Stamford, CT 06906

(203)357-7055 FAX: (203)357-1713

Contact: Jerry Hare / John A. Reffner

FT-IR Microscopes, Spectrometers, & Access.

SPI Supplies / Structure Probe, Inc.

West Chester, PA 19381-0656

(800)242-4774 (610)436-5400 FAX: (610)436-5755

Contact: Kim Royer / Andrew Blackwood

EM Prep. Equipment and Supplies / Service Lab

C. M. Taylor Co.

Sunnyvale, CA 94087

(408)245-4229 FAX: (408)732-1104

Contact: Ferren De Kildow / Dr. C. M. Taylor

Microprobe Analysis, Taylor Multi-Element Std.

Topcon Technologies, Inc.

Paramus, NJ 07652

(201)261-9450 FAX: (201)387-2710

Contact: Michael McCarthy / Frank Mannino

Digital SEM and UHR Digital SEM & TEM

Topometrix Corporation

Santa Clara, CA 95054

(408)982-9700 FAX: (408)982-9751

Contact: Tony Abbis / Paul West

Complete Line of Scanning Probe Microscopes

XEI Scientific

Redwood City, CA 94061

(415)369-0133

Contact: Ronald Vane

SEM-CLEAN Anti-contamination System for EM's

Carl Zeiss, Inc., Electron Optical Division

Thornwood, NY 10594

(800)356-1090 FAX: (914)681-7443

Contact: Paul Henry / Frank Coccla

Transmission & Scanning Electron Microscopes